Multi-Input Reference Design Optimizing Channel-to-Channel Variation for Automatic Test Equipment

1 января 2018

Texas Instrumentsопорное решениеинтегральные микросхемыисточники питаниясредства разработки и материалы

The TIDA-01050 reference design aims to improve the integration, power consumption, performance, and clocking issues typically associated with automatic test equipment. This design is applicable to any ATE system but most applicable to systems requiring a large number of input channels.

Особенности

Negative rail input (NRI), rail-to-rail output (RRO) Wide output common-mode control range Low power consumption High THD, SNR and ENOB Dual supply on AFE maximizing system performance

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Товары
Наименование
TIDA-01050 (TI)